Large radius hemispherical tip
Due to the defined hemispherical tip shape, the ideal application is material characterization by nanoindentation.
For this purpose SEM-Image (as "tif" - File) and measured radius of tip apex and the cantilver dimensions (used for calculation of lever stiffness) are included for easier post processing of indentation data.
Another application is measurement of step heights over large scan areas.
Tip Apex Specifications
| Radius: |
250 nm - 500 nm - 750 nm |
| Full cone angle: |
~ 40° |
| Tip height: |
> 9 µm |
Tip Radius Specifications
| nominal Radius |
Type |
Radius Range |
| 250 nm |
LRCH250 |
150 nm - 350 nm |
| 500 nm |
LRCH500 |
350 nm - 650 nm |
| 750 nm |
LRCH750 |
600 nm - 900 nm |
Available Cantilevers:
| C = 0.2 N/m, fo = 15 kHz |
| C = 3.0 N/m, fo = 75 kHz |
| C = 40 N/m, fo = 300 kHz |
| C = 250 N/m, fo = 575 kHz |
| C = 750 N/m, fo = 830 kHz |
Consider below listed additional packages to increase your productivity or range of experiments.
1 pack includes 5 probe-tips
