Large radius hemispherical tip
Publications from our customers:
- "High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy",
Ozgur Sahin and Natalia Erina,
Nanotechnology 19 (2008) 445717 (9pp)
- "AFM Nanoindentation of Viscoelastic Materials with Large End-Radius Probes",
Gunter Moeller,
Journal of Polymer Science: Part B: Polymer Physics, Vol. 47, 1573-1587 (2009)
Probe tips, cantilevers, and cantilever chips consist of single crystal silicon.
All cantilevers are shipped with Al-reflex coating (R).
The LRCH probes are also available with alignment grooves on the back side of the holder chip.
Shipments without reflex coating or with special coatings upon request.
All probe tips are SEM quality inspected prior to shipment.
Cantilever Dimensions:
| Stiffness |
Typical resonant frequency |
Length |
Width |
| 0.2 N/m |
15 kHz |
450 (± 15 µm) |
35 (± 3) µm |
| 3.0 N/m |
75 kHz |
225 (± 15) µm |
35 (± 3) µm |
| 40 N/m |
300 kHz |
125 (± 15) µm |
35 (± 3) µm |
| 250 N/m |
575 kHz |
125 (± 15) µm |
35 (±3) µm |
| 750 N/m |
830 kHz |
125 (± 15) µm |
35 (±3) µm |
Holder chip dimensions:
| length |
3.40 mm |
| width |
1.55 mm |
| thickness |
0.315 mm |
