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High resolution electrostatic force microscopy

High resolution electrostatic force microscopy

High aspect ratio probe tip with conductive Pt coating on tip side.

 

Tip Apex Specifications

Radius after coating : < 25 nm
Full cone angle: ~ 12°
Tip height: > 9 µm

 

Available Cantilevers:

C = 40 N/m, fo = 300 kHz
C = 3.0 N/m, fo = 75 kHz
C = 0.7 N/m, fo = 45 kHz

Standard coating on backside of cantilever is Aluminium.
Please contact us if you do not need reflex coating.

 

1 pack includes 5 probe-tips

HR-EFM


Pack: