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Cylindrical Metrology Probes

Cylindrical Metrology Probes

Probe tip, cantilever, and holder chip consist of single crystal silicon.

 

Each chip is uniquely numbered.

 

All cantilevers are shipped with Al-reflex coating.

 

Each probe is individually quality inspected by imaging in a SEM.
A certificate with measurement values and images will be provided (a sample can be found in the document section).

 

General Specifications

Cantilever dimensions length = 125 (± 15) µm
width = 35 (± 3) µm
Typical stiffness: 40 N/m
Resonant frequency: 300 (± 95) kHz
Holder chip dimensions length = 3.40 mm
width = 1.55 mm
thickness = 0.32 mm

 

CDP


Pack: