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Tilt Corrected High Aspect Ratio Probe

Tilt Corrected High Aspect Ratio Probe

Multipurpose tip for simultaneous measurement of roughness and large step height, with the tip being orthogonal to the sample surface.

 

Tip Apex Specifications

Radius: < 20 nm,  typ. 10 nm
Full cone angle: < 10° for > 2 µm
Tip height: > 9 µm
Tip tilt: ~ 12°

 

Available Cantilevers:

C = 40 N/m, fo = 300 kHz

 

1 pack includes 5 probe-tips

TC-HAR5


Pack:




Additional product