Super Sharp Improved Super Cone
Probe tips, cantilevers, and cantilever chips consist of single crystal silicon.
Tip Apex Specifications
| Radius: |
< 5 nm |
| Full cone angle: |
< 5° for ~ 150 nm |
| Tip height: |
> 9 µm |
All cantilevers are shipped with Al-reflex coating (R).
The SS-ISC probes are also available with alignment grooves on the back side of the holder chip.
Shipments without reflex coating or with special coatings upon request.
All probe tips are SEM quality inspected prior to shipment.
Cantilever Dimensions:
| Stiffness |
Typical resonant frequency |
Length |
Width |
| 0.2 N/m |
15 kHz |
450 (± 15 µm) |
35 (± 3) µm |
| 0.7 N/m |
45 kHz |
225 (± 15) µm |
35 (± 3) µm |
| 3.0 N/m |
75 kHz |
225 (± 15) µm |
35 (± 3) µm |
| 40 N/m |
300 kHz |
125 (± 15) µm |
35 (± 3) µm |
Holder chip dimensions:
| Length |
3.40 mm |
| Width |
1.55 mm |
| Thickness |
0.315 mm |
