High resolution electrostatic force microscopy
Probe tips, cantilevers, and cantilever chips consist of single crystal silicon.
All cantilevers are shipped with Al-reflex coating (R).
The HR-EFM probes are also available with alignment grooves on the back side of the holder chip.
Shipments without reflex coating or with special coatings upon request.
All probe tips are SEM quality inspected prior to shipment.
Cantilever Dimensions:
| Stiffness |
Typical resonant frequency |
Length |
Width |
| 40 N/m |
300 kHz |
125 (± 15) µm |
35 (± 3) µm |
| 3.0 N/m |
75 kHz |
225 (± 15) µm |
35 (± 3) µm |
| 0.7 N/m |
45 kHz |
225 (± 15) µm |
35 (± 3) µm |
Holder chip dimensions:
| Length |
3.40 mm |
| Width |
1.55 mm |
| Thickness |
0.315 mm |
