AFM probe tips for scanning probe microscopy - silicon mems - Team Nanotec
Shop Overview
Aspire - Conical AFM Tips
AFM probes are conically-shaped AFM tips for the mass-market. Made of high quality, highly doped single crystal silicon, the aspire probes are robust and offer long imaging life.
Probe tip characterizers are used to check the shape and the dimension of the probe tip. Each cell is numbered, which facilitates recalibration at the identical position.
Using MEMS technology we fabricate beam shaping apertures with well controlled profiles, extremely smooth sidewalls, very small corner radii and precise dimensions.
Team Nanotec metrology probes for use in 3D-AFM systems comprise round probes for measureing line or trench width and shape as well as cylindrical probes for depth measurements.
