Probe tip characterizers Probe tip characterizers are used to check the shape and the dimension of the probe tip. Each cell is numbered, which facilitates recalibration at the identical position. IVPS100 - Improved Vertical Parallel Structure Tip width characterizer with an array of 5 lines 100 nm wide. Product Information IVPS100A - Improved Vertical Parallel Structure Tip width characterizer with an array of 5 lines 100 nm wide and a single line 100 nm wide for larger tips. Product Information IVPS100-PTB - Improved Vertical Parallel Structure Tip width characterizer with an array of 5 lines, line width varying from 50 nm to 130 nm in steps of 20 nm. Designed in collaboration with Physikalisch Technische Bundesanstalt, Braunschweig, Germany. Product Information I2FSR - Improved Flared Silicon Ridge Product Information
